Please note:RBD Instruments is closed beginning December 19, 2025, reopening on January 12, 2026, to give our team members time to enjoy the holiday season and for yearly inventory. We will be monitoring support and sales inquiries during this time, but our response time may be delayed.

Tech Tips (legacy)

We've gone to the vault and are reposting our tech-tips for older PHI / Perkin-Elmer high-vacuum spectroscopy systems.

Legacy Tech Tips

04-161 Pin-outs
04-303 Ion Source Theory, Operation and Alignment
04-500/548 X-Ray Source Filament Test
10-155 Electron Source Detail
10-155 Filament Change Procedure
11-065 28 V Supply Check
11-065 Raster Size Modification
11-065 Remote Meter (Pressure) Application Note
11-155 Power Supply
11-500A AES Energy Calibration
11-500A and 20-805 Analog AES Input Test Procedure
18-085 Analog Error Amp Board Adjustments:
25-120A Filament Housing Cleaning Procedure
25-120A Low Signal/Noise Problems
20-150/20-250 Modifications and the RBD147 Interface Units
20-622 Steering Voltage Adjustment Procedure.
25-270 Analyzer Filament Procedure
32-100 Multiplier Drop Out
32-100 Supply Pin-outs
32-150 Digital AES Analyzer Control Calibration Procedure
545 Up-to-air and Pumpdown Procedure
590 Analyzer Filament Replacement Procedure
600/660 Objective Coil Replacement Procedure
AES Calibration when using a 20-805 Analyzer Control
Argon and Oxygen Bottle Replacement for PHI Systems
Card Rack Power Supply PM Check
CMA conical ceramics
DIG III Set-point Bypass Jumper
Duoplasmatron Rebuild Procedure
High- and Low-Voltage Extender Cards
Imaging on a PHI 600 or 660 System
Ion Beam Induced Low Energy Electrons
Ion Gauge Filament Replacement Procedure
Ion Source Alignment
Ion Pump Rejuvenation Procedure
LaB6 Filament Burn-in Procedure
Model 78 Sample Bias Box Replacement Batteries
Nitrogen Venting for PHI Systems
PHI X-ray Source Bake-Out Tips
SCA Power Supply Equivalent Circuit
TCP040 Connections
V/F PreAmp Test Procedure