SIMS Positional Alignment Command
Choosing the SIMS Positional Alignment command from the System menu displays
the SIMS Positional Alignment Dialog.
Normally, a SIMS Positional Alignment routine is performed for each sample
being analyzed, in order to physically position the extraction lens and to choose
the proper voltages for the SIMS analyzer. This routine is also useful for
setting up the Ion Gun.
Note that if you will be acquiring both positive and negative SIMS data for a
particular sample, you must perform a separate alignment procedure for both
positive and negative SIMS.
Analyzer settings for adjusted during the alignment for both positive and
negative SIMS are stored separately by AugerScan, and become the default settings
for any SIMS acquisitions taken thereafter.
The Neutralizer and Ion Gun can be controlled during a positional alignment by
clicking on their respective buttons in the SIMS positional alignment dialog.
In addition to the alignment, the dialog box for the SIMS Positional Alignment
command provides an interface for capturing a SIMS map (image). The
parameters uses are the same as for the alignment. The map itself is created by
rastering in both the x and y directions over the same path as the alignmnet, using
the same analzer settings. Note that the selected alginment mode does not
matter, since the computer controls both x and y (neither are free running). The
image is saved as a bitmap.
The procedure for performing a SIMS Positional Alignment depends on various
system parameters. Please consult your system documentation for more information.
A standard SIMS Alignment can also be used and is useful for calibrating peak
shape. Click here for more information.
You can save and recall the SIMS Positional Alignment settings. The three
buttons on the upper right of the dialog may be selected to Save, Load, and Revert
the settings.
Use the What’s This Help to get information about the fields in the displayed dialog box.