About Depth Profiles

AugerScan requires information about the element(s) for which you want to acquire a depth profile. If you are using AES (Auger) or XPS, AugerScan provides the information. If you are using SIMS, you must provide the information.

For AES depth profiles, you can edit the existing information that AugerScan automatically provides for you, as well as add new information. Click here to see the information AugerScan needs when you define or edit existing elements.

For SIMS depth profiles, you must provide all the information; none is provided by AugerScan. Click here to see the information that AugerScan needs to acquire SIMS depth profiles. Note: The elements that you define for a SIMS depth profile are available to all SIMS acquisitions.

You can view all the regions for a depth profile at the same time. You can also scroll through the cycles for each region. Click here for more information.

You can view all the regions for a multiplex at the same time. You can also scroll through the cycles for each region. Click here for more information.

AugerScan also provides a command to open each depth profile survey region in an individual window at once. Additionally, you may set a view option to display acquired data in a window dedicated to a particular region (instead of showing the acquisition in all region windows).

You can expand the X-axis for all depth profiles by selecting the Expand X-Axis command from the View menu.

The x-axis of a depth profile can be displayed in cycles, time, or depth. You can also select the Mark/Track command to trace a profile and display the cycle, time, and depth for a particular cycle in the status bar.

If you want to only sputter your sample without acquiring data, select the Sputter command from the System menu.

For instructions on acquiring depth profiles as they pertain to a specific technique, click on the one of the items below:

AES (Auger) Depth Profiles

XPS Depth Profiles

SIMS Depth Profiles