Command
| Applicability
|
Undo
| Unused
|
Copy
| Applies to currently selected acquisition. Copies acquisition to clipboard
|
Paste
| Applies to any OLE object currently on clipboard
|
Delete
| Applies to currently selected OLE object or annotation
|
Mark/Track
| AES Surveys; SIMS Surveys, Depth Profiles
|
Markers
| AES Surveys; SIMS Surveys
|
Select Endpoints
| XPS Surveys (includes depth profile and multiplex regions), AES multiplexes
and depth profiles
|
Endpoints
| XPS Surveys (includes depth profile regions and multiplex regions), AES
multiplexes and depth profiles Note: Endpoint selection and removal for depth
profiles may be accomplished with one or all cycles selected. However the endpoints
apply to all cycles for that region.
|
Annotations
| All
|
Element Table
| AES, XPS, SIMS acquisition techniques. Note: Element tables can be edited at
any time, it does not matter which technique is selected
|
Insert New Object
| All
|
Links
| Applies only when a linked OLE object is selected.
|
Object
| Applies to a selected object. Note: The name of this command will change to
reflect the selected object (for example, when a bitmap is selected, the command
name may say Bitmap Image Object. A cascading menu will appear with all
functions applicable to that object.
|
Command
| Applicability
|
Toolbar
| Global (always applies)
|
Status Bar
| Global (always applies)
|
Zoom
| Applies to currently selected window
|
Restore
| Applies to currently selected zoomed window
|
Raw Data
| Applies to currently selected acquisition
|
Transformed Data
| Applies to currently selected acquisition. Available only if data has been
transformed
|
Cycles
| Applies to currently selected depth profile
|
Time
| Applies to currently selected depth profile
|
Depth
| Applies to currently selected depth profile
|
Expand X Axis
| Applies to currently selected depth profile
|
| Note: The above four features may be selected if any depth profile window is
selected, but only affect the peak graph, not the individual regions
|
Options
| Global; always applies. Dialog box features are marked if they apply only to
certain acquisition types
|
Command
| Applicability
|
Start
| Applies to currently selected accusation. Note: for depth profiles and
mutlipexes, there must be at least one region present
|
Stop
| Applies to acquisition currently being acquired
|
Stop Now
| Applies to acquisition currently being acquired
|
Continue
| Applies to any previously acquired acquisition
|
Settings
| Applies to selected acquisition.
Notes: All features of the Acquisition Settings dialog boxes are available at
all times with the exception of Edit Gun Settings, which only applies if data
has been acquired. The Apply button is not available if the acquisition has been
acquired; you can not apply new settings if data is present. However, you may
re-acquire.
|
Edit
| Applies to the currently selected acquisition if data has been acquired
|
Sample Properties
| Applies to the currently selected acquisition. If using a manual stage
control, these properties will be global for any subsequent acquisitions.
|
New…
| Global; always available
|
Technique
| Global; applies to the next new acquisition. This does not change the technique of the currently selected acquisition
|
Options
| Applies to all acquisitions.
|
Command
| Applicability
|
Revert to Raw
| Applies to selected acquisition if data has been transformed
|
Edit Raw Data
| All surveys, including depth profile and multiplex regions. All alignments
|
Differentiate
| All acquisitions. For depth profile and multiplexes, applies to all surveys
and cycles.
|
Smooth
| All acquisitions. For depth profile and multiplexes, applies to all surveys
and cycles.
|
Convert to Counts
| All acquisitions. For depth profile and multiplexes, applies to all surveys
and cycles.
|
Shift
| All surveys. For depth profile regions, if all cycles are selected, all are
shifted. Applies to raw or transformed data as selected in the dialog box.
All alignments. Applies to raw or transformed data as selected in the dialog
box
|
Atomic Concentration
| All surveys except SIMS. For AES, surveys must be differentiated or acquired
as lock-in, and at least one peak must be marked. For XPS, at least one
endpoint must be marked
All multiplexes except SIMS. For AES, multiplex must be differentiated. For
XPS, the endpoints for each region must be marked.
All depth profiles except SIMS. For AES, depth profile must be
differentiated. For XPS, endpoints for each region must be marked
|
Deconvolute X-Ray Line
| All XPS acquisitions. For depth profile and multiplexes, applies to all
surveys and cycles.
|
Satellite Subtraction
| All XPS acquisitions. For depth profile and multiplexes, applies to all
surveys and cycles.
|
Baseline
| Any XPS multiplex region. Endpoints for the selected region must be marked.
|
Curve Fit / Delete Curve Fit
| Any XPS multiplex region. Endpoints for the selected region must be marked.
|