SIMS Positional Alignment Command

Choosing the SIMS Positional Alignment command from the System menu displays the SIMS Positional Alignment Dialog.

Normally, a SIMS Positional Alignment routine is performed for each sample being analyzed, in order to physically position the extraction lens and to choose the proper voltages for the SIMS analyzer. This routine is also useful for setting up the Ion Gun.

Note that if you will be acquiring both positive and negative SIMS data for a particular sample, you must perform a separate alignment procedure for both positive and negative SIMS.

Analyzer settings for adjusted during the alignment for both positive and negative SIMS are stored separately by AugerScan, and become the default settings for any SIMS acquisitions taken thereafter.

The Neutralizer and Ion Gun can be controlled during a positional alignment by clicking on their respective buttons in the SIMS positional alignment dialog.

In addition to the alignment, the dialog box for the SIMS Positional Alignment command provides an interface for capturing a SIMS map (image). The parameters uses are the same as for the alignment. The map itself is created by rastering in both the x and y directions over the same path as the alignmnet, using the same analzer settings. Note that the selected alginment mode does not matter, since the computer controls both x and y (neither are free running). The image is saved as a bitmap.

The procedure for performing a SIMS Positional Alignment depends on various system parameters. Please consult your system documentation for more information.

A standard SIMS Alignment can also be used and is useful for calibrating peak shape. Click here for more information.

You can save and recall the SIMS Positional Alignment settings. The three buttons on the upper right of the dialog may be selected to Save, Load, and Revert the settings.

Use the What’s This Help to get information about the fields in the displayed dialog box.