AugerScan Feature List

The information below is organized by menu. For each command in the menu, we have provided the types and techniques of acquisition(s) to which the command applies.

Notes:

File Menu

Command
Applicability

In general, the commands apply to all acquisitions.
Page Setup
Global (applies to all printouts).
Print
Print operations apply to the currently selected window.

Edit Menu

Command
Applicability
Undo
Unused
Copy
Applies to currently selected acquisition. Copies acquisition to clipboard
Paste
Applies to any OLE object currently on clipboard
Delete
Applies to currently selected OLE object or annotation
Mark/Track
AES Surveys; SIMS Surveys, Depth Profiles
Markers
AES Surveys; SIMS Surveys
Select Endpoints
XPS Surveys (includes depth profile and multiplex regions), AES multiplexes and depth profiles
Endpoints
XPS Surveys (includes depth profile regions and multiplex regions), AES multiplexes and depth profiles Note: Endpoint selection and removal for depth profiles may be accomplished with one or all cycles selected. However the endpoints apply to all cycles for that region.
Annotations
All
Element Table
AES, XPS, SIMS acquisition techniques. Note: Element tables can be edited at any time, it does not matter which technique is selected
Insert New Object
All
Links
Applies only when a linked OLE object is selected.
Object
Applies to a selected object. Note: The name of this command will change to reflect the selected object (for example, when a bitmap is selected, the command name may say Bitmap Image Object. A cascading menu will appear with all functions applicable to that object.

View Menu

Command
Applicability
Toolbar
Global (always applies)
Status Bar
Global (always applies)
Zoom
Applies to currently selected window
Restore
Applies to currently selected zoomed window
Raw Data
Applies to currently selected acquisition
Transformed Data
Applies to currently selected acquisition. Available only if data has been transformed
Cycles
Applies to currently selected depth profile
Time
Applies to currently selected depth profile
Depth
Applies to currently selected depth profile
Expand X Axis
Applies to currently selected depth profile

Note: The above four features may be selected if any depth profile window is selected, but only affect the peak graph, not the individual regions
Options
Global; always applies. Dialog box features are marked if they apply only to certain acquisition types

Acquisition Menu

Command
Applicability
Start
Applies to currently selected accusation. Note: for depth profiles and mutlipexes, there must be at least one region present
Stop
Applies to acquisition currently being acquired
Stop Now
Applies to acquisition currently being acquired
Continue
Applies to any previously acquired acquisition
Settings
Applies to selected acquisition.
Notes: All features of the Acquisition Settings dialog boxes are available at all times with the exception of Edit Gun Settings, which only applies if data has been acquired. The Apply button is not available if the acquisition has been acquired; you can not apply new settings if data is present. However, you may re-acquire.
Edit
Applies to the currently selected acquisition if data has been acquired
Sample Properties
Applies to the currently selected acquisition. If using a manual stage control, these properties will be global for any subsequent acquisitions.
New…
Global; always available
Technique
Global; applies to the next new acquisition. This does not change the technique of the currently selected acquisition
Options
Applies to all acquisitions.

Data Menu

Note: Some of the data options are available for all technique types even if they do not make sense from an analytical standpoint. For example, you can differentiate an XPS or SIMS survey, although it is unlikely one would want to. It is left to you to decide the applicability of certain massage and analysis operations. The software lets these features to be used for experimentation purposes.

Command
Applicability
Revert to Raw
Applies to selected acquisition if data has been transformed
Edit Raw Data
All surveys, including depth profile and multiplex regions. All alignments
Differentiate
All acquisitions. For depth profile and multiplexes, applies to all surveys and cycles.
Smooth
All acquisitions. For depth profile and multiplexes, applies to all surveys and cycles.
Convert to Counts
All acquisitions. For depth profile and multiplexes, applies to all surveys and cycles.
Shift
All surveys. For depth profile regions, if all cycles are selected, all are shifted. Applies to raw or transformed data as selected in the dialog box.
All alignments. Applies to raw or transformed data as selected in the dialog box
Atomic Concentration
All surveys except SIMS. For AES, surveys must be differentiated or acquired as lock-in, and at least one peak must be marked. For XPS, at least one endpoint must be marked
All multiplexes except SIMS. For AES, multiplex must be differentiated. For XPS, the endpoints for each region must be marked.
All depth profiles except SIMS. For AES, depth profile must be differentiated. For XPS, endpoints for each region must be marked
Deconvolute X-Ray Line
All XPS acquisitions. For depth profile and multiplexes, applies to all surveys and cycles.
Satellite Subtraction
All XPS acquisitions. For depth profile and multiplexes, applies to all surveys and cycles.
Baseline
Any XPS multiplex region. Endpoints for the selected region must be marked.
Curve Fit / Delete Curve Fit
Any XPS multiplex region. Endpoints for the selected region must be marked.

The commands in the System menu are global and in general always apply. However, some commands may only be supported if applicable system hardware is available, and is utilized by the selected technique.

The commands in the Window, and Help menus are global and always apply.